Technical Proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010
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Nanotech 2010 Vol. 2
Chapter 10: Computational Methods, Simulation & Software Tools
Finite Element Modeling and Analysis of CMOS-SAW Sensors
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| Authors: | O. Tigli, M.E. Zaghloul |
| Affiliation: | Washington State University Vancouver, US |
| Pages: | 601 - 604 |
| Keywords: | MEMS, biosensor, FEM, CMOS, surface acoustic wave |
| Abstract: | Finite element (FE) modeling and performance analysis of Surface Acoustic Wave (SAW) devices that are developed in CMOS (Complementary Metal Oxide Semiconductor) technology are presented. CMOS-SAW devices were designed, fabricated and characterized as a biosensor for breast cancer biomarker detection [1]. A detailed 3D model with 18 CMOS layers and a structured FE analyses methodology are laid out to extract the acoustic behavior of the substrate and the piezoelectric material of interest, zinc oxide (ZnO). The model represents 0.5 μm AMIS 3-metal, 2-poly process that was used to fabricate CMOS-SAW devices. A three-step analysis encompassing modal, harmonic and transient simulations is detailed. Experimental characterization results for the fabricated CMOS-SAW devices with operating frequency of 322.7 MHz show close agreement to the FE simulations with only 0.8 % deviations for operation frequency. Displacement, stress/strain maps for wave propagation, induced voltage distribution and phase responses are also presented. The results demonstrate that commercial FEM toolsets can provide valuable insight into understanding acoustoelectric interactions and wave characteristics or can readily be used for accurate design parameter extraction through reliable simulation of SAW device performance. |
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