Magnetic properties of Sputter deposited and magnetically annealed IrMn/CoFeB nanometric bilayers for exchange biased magnetic tunnel junctions

Technical Proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010

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	Nanotech 2010 Vol. 1 Chapter 1: Nanoscale Materials Characterization Magnetic properties of Sputter deposited and magnetically annealed IrMn/CoFeB nanometric bilayers for exchange biased magnetic tunnel junctions
Authors:	H. Fulara, M. Raju, S. Chaudhary, S.C. Kashyap, D.K. Pandya
Affiliation:	Inidan Institute of Technology Delhi, IN
Pages:	133 - 136
Keywords:	thin films, magnetism, sputtering
Abstract:	The work relates to the exploring the means of controlling the coercivities of the ferromagnetic thin films in a Magnetic Tunnel Junction Stack. Exchange bias route is a very powerful route in achieving this task. We intend to demonstrate this in the CoFeB(FM)-IrMn(AF) bilayers grown by sputtering technique.
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