Technical Proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010
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Nanotech 2010 Vol. 2
Chapter 7: Sensing Systems & Wireless Networks
Development of Quantitative Adhesive Force Measurement Systems for Flexible Electronics
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| Authors: | M. Kim, J. Park, B. Choi |
| Affiliation: | Sogang University, KR |
| Pages: | 405 - 408 |
| Keywords: | adhesive force |
| Abstract: | In this paper, a novel adhesive force measurement system is developed to measure adhesive forces from interacting surfaces. In previous paper, the adhesive force was measured with tens/hundreds of uN, and the displacement was measured with tens of nm resolution. Here, we used a high resolution force sensor and a high resolution z-stage to increase sensitivity in adhesive force measurement with under a few uN and tens of nm resolution. The force measurement part is fixed on a uniformly drilling plate, which assembled manual z-stage, piezo z-stage, and force sensor. Using the force sensor in the adhesive force measurement system, a pull-off force of an adhesive layer is measured. At this time, we measured multiple sections of the 300 mm width film. Database, that is the measured pull-off force of each adhesive layer was created. |
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