Technical Proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010
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Nanotech 2010 Vol. 3
Chapter 2: Bio Analytical Instrumentation
Nanoparticle size and shape evaluation using the TSOM optical microscopy method
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| Authors: | R. Attota, R.M. Silver, A. Vladar |
| Affiliation: | NIST, US |
| Pages: | 172 - 175 |
| Keywords: | TSOM, nanoparticle, nanometrology, measurement, metrology |
| Abstract: | We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope, by analyzing through-focus scanning optical microscope (TSOM - pronounced as ‘tee-som’) images obtained at different focus positions. In principle, this technique can be used to identify which dimension is changing between two nanosized targets and to determine the dimension using a library-matching method. This methodology has potential utility for a wide range of target geometries and application areas, including nanomanufacturing, defect analysis, semiconductor process control, and biotechnology. In the current paper we present nanoparticle size and shape evaluation using the TSOM method. |
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